Biomaterial Database

Effect of Nd:YAG, Ho:YAG, Er:YAG, CO2, and GaAIAs laser irradiation on surface properties of endosseous dental implants. 2002

Matthias Kreisler, and Hermann Götz, and Heinz Duschner

Department of Oral Surgery, Johannes Gutenberg University, Mainz, Germany. matthiaskreisler@web.de

OBJECTIVE To analyze potential surface alterations in endosseous dental implants induced by irradiation with common dental lasers. METHODS Sandblasted and acid-etched, plasma-sprayed, hydroxyapatite-coated, and smooth titanium discs were irradiated using Nd:YAG, Ho:YAG, Er:YAG, CO2, and GaAIAs lasers at various power settings. The specimens were examined by scanning electron microscopy and energy dispersive spectroscopy. RESULTS In an energy-dependent manner, the pulsed YAG lasers induced partial melting, cracking, and crater formation on all 4 surfaces. Within the energy range applied, the CO2 laser caused surface alterations on the hydroxyapatite and plasma coatings as well as in the acid-etched surface. GaAIAs laser irradiation did not damage any of the surfaces. Energy dispersive spectroscopy revealed an altered chemical compound of the surfaces with regard to titanium, oxygen, and silicon. CONCLUSIONS The clinical application of most common dental laser systems can induce implant surface alterations. Relevant factors are not only the laser system and power setting, but also the application system. CONCLUSIONS The results of the study indicate that Nd:YAG and Ho:YAG lasers are not suitable for use in decontamination of implant surfaces, irrespective of the power output. With the Er:YAG and CO2 laser, the power output must be limited so as to avoid surface damage. The GaAIAs laser seems to be safe as far as possible surface alterations are concerned.

UI	MeSH Term	Description	Entries
D007834	Lasers	An optical source that emits photons in a coherent beam. Light Amplification by Stimulated Emission of Radiation (LASER) is brought about using devices that transform light of varying frequencies into a single intense, nearly nondivergent beam of monochromatic radiation. Lasers operate in the infrared, visible, ultraviolet, or X-ray regions of the spectrum.	Masers,Continuous Wave Lasers,Pulsed Lasers,Q-Switched Lasers,Continuous Wave Laser,Laser,Laser, Continuous Wave,Laser, Pulsed,Laser, Q-Switched,Lasers, Continuous Wave,Lasers, Pulsed,Lasers, Q-Switched,Maser,Pulsed Laser,Q Switched Lasers,Q-Switched Laser
D008855	Microscopy, Electron, Scanning	Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.	Scanning Electron Microscopy,Electron Scanning Microscopy,Electron Microscopies, Scanning,Electron Microscopy, Scanning,Electron Scanning Microscopies,Microscopies, Electron Scanning,Microscopies, Scanning Electron,Microscopy, Electron Scanning,Microscopy, Scanning Electron,Scanning Electron Microscopies,Scanning Microscopies, Electron,Scanning Microscopy, Electron
D009354	Neodymium	An element of the rare earth family of metals. It has the atomic symbol Nd, atomic number 60, and atomic weight 144.24, and is used in industrial applications.
D002245	Carbon Dioxide	A colorless, odorless gas that can be formed by the body and is necessary for the respiration cycle of plants and animals.	Carbonic Anhydride,Anhydride, Carbonic,Dioxide, Carbon
D003666	Decontamination	The removal of contaminating material, such as radioactive materials, biological materials, or CHEMICAL WARFARE AGENTS, from a person or object.
D004577	Electron Probe Microanalysis	Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.	Microscopy, Electron, X-Ray Microanalysis,Spectrometry, X-Ray Emission, Electron Microscopic,Spectrometry, X-Ray Emission, Electron Probe,X-Ray Emission Spectrometry, Electron Microscopic,X-Ray Emission Spectrometry, Electron Probe,X-Ray Microanalysis, Electron Microscopic,X-Ray Microanalysis, Electron Probe,Microanalysis, Electron Probe,Spectrometry, X Ray Emission, Electron Microscopic,Spectrometry, X Ray Emission, Electron Probe,X Ray Emission Spectrometry, Electron Microscopic,X Ray Emission Spectrometry, Electron Probe,X-Ray Microanalysis,Electron Probe Microanalyses,Microanalyses, Electron Probe,Microanalysis, X-Ray,Probe Microanalyses, Electron,Probe Microanalysis, Electron,X Ray Microanalysis,X Ray Microanalysis, Electron Microscopic,X Ray Microanalysis, Electron Probe
D004871	Erbium	Erbium. An element of the rare earth family of metals. It has the atomic symbol Er, atomic number 68, and atomic weight 167.26.
D005708	Gallium	A rare, metallic element designated by the symbol, Ga, atomic number 31, and atomic weight 69.72.
D006695	Holmium	An element of the rare earth family of metals. It has the atomic symbol Ho, atomic number 67, and atomic weight 164.93.
D013499	Surface Properties	Characteristics or attributes of the outer boundaries of objects, including molecules.	Properties, Surface,Property, Surface,Surface Property