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We study the growth and structure of thin films of the organic semiconductor rubrene during organic molecular beam deposition (OMBD) on silicon oxide in situ and in real time using X-ray scattering. Using in situ grazing incidence diffraction (GID) we find a small degree of local order but an otherwise largely disordered structure, consistent with out of plane scans. Monitoring the surface morphology in real time during growth, we find relatively smooth films (surface roughness sigma below approximately 15 A for thicknesses up to at least 600 A) and a significant delay before the onset of roughening. This anomalous roughening in the beginning and crossover to normal roughening later during growth may be related to conformational changes of rubrene in the early stages of growth.
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
August 1995,
Physical review letters,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
May 2017,
Nano letters,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
April 2009,
Physical review. E, Statistical, nonlinear, and soft matter physics,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
January 2016,
Scientific reports,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
May 1979,
Applied optics,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
December 2014,
Langmuir : the ACS journal of surfaces and colloids,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
July 2014,
Applied optics,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
October 1996,
Physical review. B, Condensed matter,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
March 1995,
Optics letters,
S Kowarik, and
A Gerlach, and
S Sellner, and
F Schreiber, and
J Pflaum, and
L Cavalcanti, and
O Konovalov
August 2005,
Physical chemistry chemical physics : PCCP,
