The effect of gibberellic acid on the content and distribution of silicon in the stem, leaf sheath, and leaf lamina of sugarcane was analyzed in relation to the effect of gibberellic acid on stem growth. Silicon content was measured by neutron activation analysis, and its distribution was followed by scanning electron microscopy and X-ray analysis.Foliarly applied gibberellic acid increased stem length and fresh weight and decreased silicon content. Gibberellic acid treatments had little or no effect on growth or silicon content of leaf laminae or sheaths. The close correlation between increase in growth of an internode in response to gibberellic acid and the decrease in silicon content of that internode indicated a dilution effect of growth on the amount of silicon rather than a direct effect of gibberellic acid on silicon deposition. This conclusion was supported by scanning electrom microscopy, X-ray map photos, and counts of silica cells per unit of epidermis area.