The drive to smaller and smaller computational devices demands control over the structure, composition, and magnetic properties of materials on a sub-100-nanometer scale. In his Perspective, Scholl highlights a report by Heinze et al., who have been able to image an antiferromagnetic Mn monolayer at atomic resolution using a technique called spin-polarized scanning tunneling microscopy. Because of its unrivaled resolution, this technique is likely to provide insights into magnetic interactions that are of fundamental importance to magnetic devices.