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Simple method for the determination of optical constants of absorbing materials. 1969

E Schmidt

A method which uses the maximum value of (R(s) - R(p))/(R(s) + R(p)) and the angle of incidence Phi(B) at that maximum measured by a rotating polarizer is developed for the determination of optical constants of absorbing solids. This method was used for the measurement of the optical constants of germanium in the spectral region 1.8-2.7 eV and of silicon in 2.0-3.7 eV at room temperature.

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