A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns. 2011

Philip N H Nakashima, and Alexander F Moodie, and Joanne Etheridge
ARC Centre of Excellence for Design in Light Metals, Monash University, Victoria 3800, Australia. Philip.Nakashima@monash.edu

The intensity distribution in three-beam CBED patterns from centrosymmetric crystals can be inverted analytically to enable the direct measurement of crystal structure amplitudes and three-phase invariants. The accuracy of the measurements depends upon the accuracy and precision with which specific loci within the discs can be identified. The present work exploits the equivalence in form of the intensity distribution along these loci to provide an algorithm for their automated location, enabling the rapid and unequivocal identification of their position. Moreover, it demonstrates how the loci can be used to determine directly the relative magnitudes of structure amplitudes with superior accuracy and without recourse to complex pattern-matching calculations.

UI MeSH Term Description Entries
D003461 Crystallography The branch of science that deals with the geometric description of crystals and their internal arrangement. (McGraw-Hill Dictionary of Scientific and Technical Terms, 4th ed) Crystallographies
D004583 Electrons Stable elementary particles having the smallest known negative charge, present in all elements; also called negatrons. Positively charged electrons are called positrons. The numbers, energies and arrangement of electrons around atomic nuclei determine the chemical identities of elements. Beams of electrons are called CATHODE RAYS. Fast Electrons,Negatrons,Positrons,Electron,Electron, Fast,Electrons, Fast,Fast Electron,Negatron,Positron
D000465 Algorithms A procedure consisting of a sequence of algebraic formulas and/or logical steps to calculate or determine a given task. Algorithm
D046529 Microscopy, Electron, Transmission Electron microscopy in which the ELECTRONS or their reaction products that pass down through the specimen are imaged below the plane of the specimen. Electron Diffraction Microscopy,Electron Microscopy, Transmission,Microscopy, Electron Diffraction,Transmission Electron Microscopy,Diffraction Microscopy, Electron,Microscopy, Transmission Electron

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