Computer-simulated X-ray three-beam pinhole topographs for spherical silicon crystals. 2011

Kouhei Okitsu
Nano-Engineering Research Center, Institute of Engineering Innovation, Graduate School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Tokyo 113-8656, Japan. okitsu@soyak.t.u-tokyo.ac.jp

X-ray three-beam pinhole topograph images for spherical silicon crystals were computer-simulated based on the n-beam Takagi-Taupin (T-T) equation. They were compared with those for parallel-plate crystals. The procedure to integrate the n-beam T-T equation for a crystal with an arbitrary shape has been validated in a separate paper [Okitsu et al. (2011), Acta Cryst. A67, 550-556] from comparison between experimentally obtained and computer-simulated six-beam pinhole topographs for a channel-cut silicon crystal.

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