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A specimen holder for low-temperature scanning electron microscopy. 1990

J Bastacky, and C Goodman, and T L Hayes
Donner Laboratory, Lawrence Berkeley Laboratory, University of California, Berkeley 94720.

A miniature vise built into a copper stub is described that holds bulk, pre-frozen, hydrated biological specimens during examination under the electron beam of the scanning electron microscope.

UI MeSH Term Description Entries
D008855 Microscopy, Electron, Scanning Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY. Scanning Electron Microscopy,Electron Scanning Microscopy,Electron Microscopies, Scanning,Electron Microscopy, Scanning,Electron Scanning Microscopies,Microscopies, Electron Scanning,Microscopies, Scanning Electron,Microscopy, Electron Scanning,Microscopy, Scanning Electron,Scanning Electron Microscopies,Scanning Microscopies, Electron,Scanning Microscopy, Electron
D005615 Freezing Liquids transforming into solids by the removal of heat. Melting

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