X-ray irradiation induced reversible resistance change in Pt/TiO2/Pt cells. 2014

Seo Hyoung Chang, and Jungho Kim, and Charudatta Phatak, and Kenneth D'Aquila, and Seong Keun Kim, and Jiyoon Kim, and Seul Ji Song, and Cheol Seong Hwang, and Jeffrey A Eastman, and John W Freeland, and Seungbum Hong
Materials Science Division, Argonne National Laboratory , Lemont, Illinois 60439, United States.

The interaction between X-rays and matter is an intriguing topic for both fundamental science and possible applications. In particular, synchrotron-based brilliant X-ray beams have been used as a powerful diagnostic tool to unveil nanoscale phenomena in functional materials. However, it has not been widely investigated how functional materials respond to the brilliant X-rays. Here, we report the X-ray-induced reversible resistance change in 40-nm-thick TiO2 films sandwiched by Pt top and bottom electrodes, and propose the physical mechanism behind the emergent phenomenon. Our findings indicate that there exists a photovoltaic-like effect, which modulates the resistance reversibly by a few orders of magnitude, depending on the intensity of impinging X-rays. We found that this effect, combined with the X-ray irradiation induced phase transition confirmed by transmission electron microscopy, triggers a nonvolatile reversible resistance change. Understanding X-ray-controlled reversible resistance changes can provide possibilities to control initial resistance states of functional materials, which could be useful for future information and energy storage devices.

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