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Nondestructive elemental depth-profiling analysis by muonic X-ray measurement. 2015

Kazuhiko Ninomiya, and Michael K Kubo, and Takashi Nagatomo, and Wataru Higemoto, and Takashi U Ito, and Naritoshi Kawamura, and Patrick Strasser, and Koichiro Shimomura, and Yasuhiro Miyake, and Takao Suzuki, and Yoshio Kobayashi, and Shinichi Sakamoto, and Atsushi Shinohara, and Tsutomu Saito
†Graduate School of Science, Osaka University, Toyonaka, Osaka 560-0043, Japan.

Elemental analysis of materials is fundamentally important to science and technology. Many elemental analysis methods have been developed, but three-dimensional nondestructive elemental analysis of bulk materials has remained elusive. Recently, our project team, dreamX (damageless and regioselective elemental analysis with muonic X-rays), developed a nondestructive depth-profiling elemental analysis method after a decade of research. This new method utilizes a new type of probe; a negative muon particle and high-energy muonic X-rays emitted after the muon stops in a material. We performed elemental depth profiling on an old Japanese gold coin (Tempo-Koban) using a low-momentum negative muon beam and successfully determined that the Au concentration in the coin gradually decreased with depth over a micrometer length scale. We believe that this method will be a promising tool for the elemental analysis of valuable samples, such as archeological artifacts.

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