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The Fourier transform-infrared (FT-IR) spectrometer is a widely used high-resolution spectral characterization method in materials, chemicals, and more. However, the inverse relation between the spectral resolution and the interferometer's arm length yields a tradeoff between spectral resolution and spectrometer footprint. Here, we introduce a novel method to overcome this traditional FT-IR resolution limit. The enhanced high-resolution multi-scan compact FT-IR spectrometer we present achieves an effectively long interferogram by combining multiple short FT-IR scans. Simulation and experimental results demonstrate a significant increase in the spectral resolution of a FT-IR spectrometer by employing our interferogram stitching algorithm.
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