Thin polymer films have found many important applications in organic electronics, such as active layers, protective layers, or antistatic layers. Among the various experimental methods suitable for studying the thermo-optical properties of thin polymer films, temperature-dependent spectroscopic ellipsometry plays a special role as a nondestructive and very sensitive optical technique. In this Review Article, issues related to the physical origin of the dependence of ellipsometric angles on temperature are surveyed. In addition, the Review Article discusses the use of temperature-dependent spectroscopic ellipsometry for studying phase transitions in thin polymer films. The benefits of studying thermal transitions using different cooling/heating speeds are also discussed. Furthermore, it is shown how the analysis and modeling of raw ellipsometric data can be used to determine the thermal properties of thin polymer films.