A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision. 2023

Guoliang Yang, and Gaohao Zhou, and Changyuan Wang, and Jing Mu, and Zhenhu Yang, and Yuan Li, and Junhong Su
School of Optoelectronic Engineering, Xi'an Technological University, China.

Optical coating damage detection is a part of both industrial production and scientific research. Traditional methods require sophisticated expert systems or experienced front-line producers, and the cost of these methods rises dramatically when film types or inspection environments change. In practice, it has been found that customized expert systems imply a significant investment of time and money, and we expect to find a method that can perform this task automatically and quickly, while at the same time the method should be adaptable to the later addition of coating types and the ability to identify damage kinds. In this paper, we propose a deep neural network-based detection tool that splits the task into two parts: damage classification and damage degree regression. Introduces attention mechanisms and Embedding operations to enhance the performance of the model. It was found that the damage type detection accuracy of our model reached 93.65%, and the regression loss was kept within 10% on different data sets. We believe that deep neural networks have great potential to tackle industrial defect detection by significantly reducing the design cost and time of traditional expert systems, while gaining the ability to detect entirely new damage types at a fraction of the cost.

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