Biomaterial Database

Change in creep rate and microstructure in an aged, low-copper amalgam. 1985

T Okabe, and R J Mitchell, and M B Butts, and S S Galloway, and W S Twiggs

Low-copper amalgams aged at 37 degrees C, 50 degrees C, 60 degrees C, 70 degrees C, and 80 degrees C for periods of 7 and 30 days were examined using a scanning electron microscope and an x-ray diffractometer. Gamma-one Ag-Hg grain size and gamma 2 Sn-Hg volume fraction, and surface area were determined by quantitative metallography. At 60 degrees C and below, gamma 1 was the predominant matrix phase. Little beta 1 Ag-Hg was found. In this temperature range, both gamma 1 grain size and ADA creep were found to obey an Arrhenius law. A linear relationship was found between the log of the mean ADA creep and the mean gamma 1 grain size. Above 60 degrees C, the gamma 1 phases and the majority of the gamma Ag-Sn particles disappeared. In their place, beta 1 appeared. Gamma-two volume fraction increased during aging at temperatures over 60 degrees C, but a coarsening of gamma 2, reflected in a decrease in gamma 2 surface area per unit volume, also took place. Aging for 30 days or less resulted in decreases in ADA creep. At 60 degrees C and below, the decrease was caused by increases in gamma 1 grain size. Above 60 degrees C, the decrease in ADA creep was caused by several factors, one of which was the appearance of large beta 1 grains.

UI	MeSH Term	Description	Entries
D007700	Kinetics	The rate dynamics in chemical or physical systems.
D008855	Microscopy, Electron, Scanning	Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.	Scanning Electron Microscopy,Electron Scanning Microscopy,Electron Microscopies, Scanning,Electron Microscopy, Scanning,Electron Scanning Microscopies,Microscopies, Electron Scanning,Microscopies, Scanning Electron,Microscopy, Electron Scanning,Microscopy, Scanning Electron,Scanning Electron Microscopies,Scanning Microscopies, Electron,Scanning Microscopy, Electron
D003300	Copper	A heavy metal trace element with the atomic symbol Cu, atomic number 29, and atomic weight 63.55.	Copper-63,Copper 63
D003723	Dental Amalgam	An alloy used in restorative dentistry that contains mercury, silver, tin, copper, and possibly zinc.	Amalgam, Dental,Amalgams, Dental,Dental Amalgams
D013696	Temperature	The property of objects that determines the direction of heat flow when they are placed in direct thermal contact. The temperature is the energy of microscopic motions (vibrational and translational) of the particles of atoms.	Temperatures
D013997	Time Factors	Elements of limited time intervals, contributing to particular results or situations.	Time Series,Factor, Time,Time Factor
D014961	X-Ray Diffraction	The scattering of x-rays by matter, especially crystals, with accompanying variation in intensity due to interference effects. Analysis of the crystal structure of materials is performed by passing x-rays through them and registering the diffraction image of the rays (CRYSTALLOGRAPHY, X-RAY). (From McGraw-Hill Dictionary of Scientific and Technical Terms, 4th ed)	Xray Diffraction,Diffraction, X-Ray,Diffraction, Xray,Diffractions, X-Ray,Diffractions, Xray,X Ray Diffraction,X-Ray Diffractions,Xray Diffractions