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A design for a simple electronic exposure meter for use with an electron microscope. 1973

G J Hills, and R T Garner

UI MeSH Term Description Entries
D008854 Microscopy, Electron Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen. Electron Microscopy
D004581 Electronics The study, control, and application of the conduction of ELECTRICITY through gases or vacuum, or through semiconducting or conducting materials. (McGraw-Hill Dictionary of Scientific and Technical Terms, 6th ed) Electronic

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