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[A simple additional device for the Siemens electron microscope Elmiskop EM-101 to introduce specimen without air-contact (author's transl)]. 1979

K Allman, and G von Eynatten

A simple additional device is shown to introduce specimen without contact to air into the Siemens electron microscope EM-101. The construction, the function and handlinf of the modified specimen airlock is described. The device is used to study oxidable crystals by electron microscopy and diffraction, and might also be promising for ultracytochemical and molecular biological problems.

UI MeSH Term Description Entries
D008854 Microscopy, Electron Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen. Electron Microscopy
D013048 Specimen Handling Procedures for collecting, preserving, and transporting of specimens sufficiently stable to provide accurate and precise results suitable for clinical interpretation. Specimen Collection,Collection, Specimen,Collections, Specimen,Handling, Specimen,Handlings, Specimen,Specimen Collections,Specimen Handlings

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