Gas chromatographic and mass spectrometric properties of ametryn and its N-dealkylated products were studied to establish the potential use in a recently reported method describing the residue analyses of these compounds by gas chromatography with N-P detection. Electron impact mass spectra show base peaks at the molecular ion (M+), and methane chemical ionization mass spectra give base peaks at (M + 1) ion for all the compounds studied. Characteristic mass spectral fragmentations of ametryn, GS-11354, GS-11355, and GS-26831 are presented. Combined gas chromatography-mass spectrometry rather than gas chromatography alone provides unambiguous residue characterization. The technique also allows quantitation of ametryn and its N-dealkylated products that cochromatograph with interfering materials present in a complex substrate.