Recent developments in electron holography for phase microscopy. 1995

A Tonomura
Advanced Research Laboratory, Hitachi, Ltd., Saitama, Japan.

This paper reports on the recent remarkable progress made in electron phase microscopy, especially due to the development of both a "coherent" field-emission electron beam and the related image processing techniques. With these techniques, the phase distribution of an electron beam transmitted through a specimen can now be measured with a precision of within 1/100 of the electron wavelength to observe the thickness distribution of a uniform specimen at the atomic level, the magnetic domain structures in a ferromagnetic thin film, and individual vortices in a superconducting thin film. Vortices in superconducting thin films have become dynamically observable by Lorentz microscopy.

UI MeSH Term Description Entries
D008854 Microscopy, Electron Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen. Electron Microscopy
D008858 Microscopy, Phase-Contrast A form of interference microscopy in which variations of the refracting index in the object are converted into variations of intensity in the image. This is achieved by the action of a phase plate. Phase-Contrast Microscopy,Microscopies, Phase-Contrast,Microscopy, Phase Contrast,Phase Contrast Microscopy,Phase-Contrast Microscopies
D006696 Holography The recording of images in three-dimensional form on a photographic film by exposing it to a laser beam reflected from the object under study.

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