-transparent.png){kind=logo}
Several techniques of the bone-implant interface uncovering in the proper way for X-ray microanalysis, were tested. The obtained results confirmed that the method of sample preparation has significantly influenced the results of investigation. The mechanical polishing, which is routinely used for preparation of surfaces to the X-ray microanalysis, introduces artifacts. Cutting by means of microtome, in the case of brittle implants, and sawing by utilizing diamond saw, in the case of metallic ones, were indicated as the optimal methods. Cleaning of the samples in the ultrasonic cleaner before covering them with conductive layer is required.
Related Publications
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
January 1987,
Folia biologica,
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
January 1980,
Acta medica Polona,
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
October 2017,
Bone,
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
January 1999,
Methods in molecular biology (Clifton, N.J.),
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
September 1979,
Journal of microscopy,
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
May 1976,
The Bulletin of Tokyo Dental College,
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
June 1995,
Clinical oral implants research,
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
January 1998,
Methods in molecular biology (Clifton, N.J.),
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
January 1982,
Scanning electron microscopy,
M Lewandowska-Szumieł, and
K Sikorski, and
A Szummer
January 1983,
Scanning electron microscopy,
